ACCELERATED NANOMATERIALS CHARACTERIZATION
Transmission electron microscopy (STEM)
The Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection (ESD). It delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions through 2D/3D chemical characterization with compositional mapping.
With innovative features designed to increase throughput, precision, and ease of use, the Talos F200X (S)TEM has been used by our team for advanced research and analysis.
Dynamic Light Scattering (DLS)
Dynamic light scattering (DLS) or Quasi-Elastic Light Scattering are one of the most used light scattering techniques, which allows to measure particle sizing down to 1 nm hydrodynamic diameter and provides information on the aggregation state of nanoparticles in fluid systems. Our nanoparticles measurements are performed on Malvern Zetasizer Nano ZS instrument equipped with a HeNe laser operating at 632.8 nm and a scattering detector at 173 degrees.
UV-Visible Nanoparticle Spectroscopy
UV-Vis spectroscopy measures the discrete wavelengths extinction of UV or visible light that absorbed or transmitted through sample. UV-Vis is a valuable tool for identifying, characterizing, and studying nanoparticles size, shape, concentration, agglomeration state, and refractive index. Our samples spectral analysis is performed on Agilent 8453 single beam diode array spectrometer which collects spectra from 190–1100 nm using a slit width of 1 nm.
Electrokinetic potential
Zeta potential measures electrochemical equilibrium and electrostatic repulsion and attraction between particle-liquid interface. These fundamental parameters affect nanomaterials stability when applied to colloidal dispersions and generally evaluate their dispersion resistance, changed within the time. Zeta potential tests of our samples was performed by Malvern Zetasizer Nano ZS instrument equipped with a HeNe laser operating at 632.8 nm and a scattering detector at 173 degrees.
Energy-dispersive X-ray spectroscopy (EDS)
Energy-dispersive X-ray spectroscopy (EDS) enables the chemical characterization and elemental analysis of nanomaterials. A sample, excited by an electron beam, dissipates the absorbed energy by ejecting a core-shell electron. A higher energy outer-shell electron then proceeds to fill its place, releasing the difference in energy as an X-ray that has a characteristic spectrum based on its atom of origin. The peaks position in the spectrum identifies the element, whereas the signal intensity corresponds to the element concentration. We analyzed our samples with ChemiSEM™ Technology, which integrates SEM and EDS functions in a single, seamless user interface.
Inductively coupled plasma mass spectroscopy (ICP-MS)
Inductively Coupled Plasma Spectroscopy (ICP) measures and identifies elements within sample matrix based on their ionization within the sample, particularly for metals and select nonmetals with atomic masses from 7-250. ICP separates the ions out by their mass-to-charge ratio and the detector counts the number of selected ions per second, which allows the instrument to determine the concentration of each chosen element. Our nanoparticles concentration has been analyzed with a Thermo X-Series II ICP-MS equipped with Collision Cell Technology for advanced interference removal.